Inventor · Lincoln, NE, US

Ping He

106Patents
16h-index
49Co-inventors
86Inventor score

Filing activity: May 31, 1985 → May 31, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US7633625B1 Spectroscopic ellipsometer and polarimeter systems Physics 108 Active
US7616319B1 Spectroscopic ellipsometer and polarimeter systems Physics 106 Active
US5666201A Multiple order dispersive optics system and method of use Physics 71 Expired
US5963327A Total internal reflection electromagnetic radiation beam entry to, and exit from, ellipsometer, polarimeter, reflectometer and the like systems Physics 61 Expired
US6634233B2 Method for determining the wall thickness and the speed of sound in a tube from reflected and transmitted ultrasound pulses Physics 51 Expired
US6883376B2 Method for determining the wall thickness and the speed of sound in a tube from reflected and transmitted ultrasound pulses Physics 47 Expired
US6323424A Multiple electrical box mounting system having removable rings Electricity 43 Expired
US6098939A Electrical junction box supporting bracket Emerging Cross-Sectional Technologies 41 Expired
US6188022A Electrical box mounting system having removable rings Electricity 35 Expired
US6982792B1 Spectrophotometer, ellipsometer, polarimeter and the like systems Physics 28 Expired
US5805285A Multiple order dispersive optics system and method of use Physics 25 Expired
US4658827A Ultrasound scanner for tissue characterization Physics 24 Expired
US6293056A Multi-purpose above-ceiling utility support system Electricity 22 Expired
US6456376B1 Rotating compensator ellipsometer system with spatial filter Physics 22 Expired
US6859278B1 Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems Physics 18 Expired
US7760820B2 Receiver having a signal reconstructing section for noise reduction, system and method thereof Electricity 16 Expired
US7158231B1 Spectroscopic ellipsometer and polarimeter systems Physics 16 Expired
US7274450B1 Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems Physics 16 Expired
US6804004B1 Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry Physics 15 Expired
US5969818A Beam folding optics system and method of use with application in ellipsometry and polarimetry Physics 14 Expired
US8886995B1 Fault tolerant state machine for configuring software in a digital computer Physics 13 Active
US7492455B1 Discrete polarization state spectroscopic ellipsometer system and method of use Physics 12 Active
US6549282B1 Methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipsometry and polarimetry systems Physics 12 Expired
US7277171B1 Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems Physics 12 Expired
US7505134B1 Automated ellipsometer and the like systems Physics 11 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.