Patent · US Expired

Test apparatus and method for testing circuit units to be tested

US7276896B2 · kind B2 · utility

3Cited by

1References

13Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Manfred Moser · Dachau, DE
Daniel Mysliwitz · Birkenfeld, DE
Erwin Thalmann · Birkenfeld, DE

Key dates

Filing date	Jun 6, 2005
Grant date	Oct 2, 2007
Priority date	—
Expiry date	Jun 6, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31907
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention provides a test apparatus for testing a circuit unit (101) to be tested having a test system (100), a control bus (102) for transferring control data (106), an address bus (103) for transferring addressing data (107) and a data bus (104) for exchanging test data (108) between the test system (100) and the circuit unit (101) to be tested. A voltage generating device (200) connected between the test system (100) and the circuit unit (101) to be tested serves for generating a predeterminable operating voltage output signal (202, 202a-202n) for the voltage supply of the circuit unit (101) to be tested in a manner dependent on a control signal (211) that is provided by the test system (100) and fed via the control bus (102).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.