Inspection device for inspecting TFT
US7282943B2 · kind B2 · utility
4Cited by
2References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 21, 2004 |
| Grant date | Oct 16, 2007 |
| Priority date | — |
| Expiry date | Oct 21, 2024 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D86/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is an inspection device which inspects a thin film transistor (TFT) for supplying a current to a light emitting element. The inspection device includes: a first current supply circuit which supplies a drain current between a drain and a source of the TFT; a gate voltage adjustment circuit which adjust a gate voltage to be applied to a gate of the TFT so as to allow a predetermined specified current to flow between the drain and source of the TFT; and a measurement unit which measures the gate voltage adjusted by the gate voltage adjustment circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.