Patent · US Expired

Method for forming interconnects on thin wafers

US7288492B2 · kind B2 · utility

5Cited by
13References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 19, 2005
Grant dateOct 30, 2007
Priority date
Expiry dateAug 30, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/19043
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of forming a semiconductor interconnect including, in the order recited: (a) providing a semiconductor wafer; (b) forming bonding pads in a terminal wiring level on the frontside of the wafer; (c) reducing the thickness of the wafer; (d) forming solder bumps on the bonding pads; and (e) dicing the wafer into bumped semiconductor chips.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.