Functional frequency testing of integrated circuits

US7290191B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Gary D. Grise · Colchester, US
• Steven F. Oakland · Colchester, US
• Anthony D. Polson · Jericho, US
• Philip Stevens · Stuttgart, DE

Key dates

• Filing date: Aug 20, 2004
• Grant date: Oct 30, 2007
• Expiry date: Aug 3, 2025

Classification

• Technology area (CPC H): Electricity
• CPC primary: H03K3/35625
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and circuits for testing an integrated circuit at functional clock frequency by providing a test controller generating control signals that assure proper latching of test patterns in scan chains at tester frequency and propagation of the test pattern through logic circuits being tested at functional clock frequency.