Device modeling for proximity effects
US7302376B2 · kind B2 · utility
4Cited by
5References
1Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 25, 2003 |
| Grant date | Nov 27, 2007 |
| Priority date | — |
| Expiry date | Mar 6, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/39
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for calibrating a software model for a given structure of interest for a variable imposed by an adjacent structure. First determine the spatial extent of the variable imposed by the adjacent structure. Then assign a value to the spatial extent, which varies as a function of distance from the adjacent structure to the given structure. Finally, attach that value to the model of the given structure.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.