Patent · US Expired

Method and system for ROM coding to improve yield

US7305638B1 · kind B1 · utility

2Cited by
4References
24Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 13, 2005
Grant dateDec 4, 2007
Priority date
Expiry dateJan 19, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C17/12
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for improving yield of a process for fabricating a read-only memory (ROM) includes evaluating a yield of a ROM fabrication process associated with a first ROM design. At least two candidate ROM design modifications are identified. At least one of the candidate ROM design modifications comprises inversion of bit values of data to be stored in the ROM. A plurality of criteria are applied, including at least an amount of yield improvement and a difficulty of implementation associated with each candidate ROM design modification. One of the candidate ROM design modifications is selected based on the application of the criteria. A modified ROM fabrication process is performed to fabricate a ROM according to the selected ROM design modification.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.