Brian E. Stine
22Patents
8h-index
42Co-inventors
75Inventor score
Filing activity: Nov 18, 1999 → Oct 14, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6795952B1 | System and method for product yield prediction using device and process neighborhood characterization vehicle | Electricity | 235 | Expired |
| US6834375B1 | System and method for product yield prediction using a logic characterization vehicle | Electricity | 222 | Expired |
| US7487474B2 | Designing an integrated circuit to improve yield using a variant design element | Physics | 175 | Expired |
| US6449749B1 | System and method for product yield prediction | Electricity | 156 | Expired |
| US6901564B2 | System and method for product yield prediction | Electricity | 127 | Expired |
| US7174521B2 | System and method for product yield prediction | Electricity | 20 | Expired |
| US6475871B1 | Passive multiplexor test structure for integrated circuit manufacturing | Electricity | 18 | Expired |
| US7024642B2 | Extraction method of defect density and size distributions | Electricity | 10 | Expired |
| US7494893B1 | Identifying yield-relevant process parameters in integrated circuit device fabrication processes | Emerging Cross-Sectional Technologies | 8 | Active |
| US7356800B2 | System and method for product yield prediction | Electricity | 8 | Active |
| US7348594B2 | Test structures and models for estimating the yield impact of dishing and/or voids | Electricity | 7 | Expired |
| US7373625B2 | System and method for product yield prediction | Electricity | 7 | Active |
| US7197726B2 | Test structures for estimating dishing and erosion effects in copper damascene technology | Electricity | 6 | Expired |
| US7673262B2 | System and method for product yield prediction | Electricity | 6 | Active |
| US7807480B2 | Test cells for semiconductor yield improvement | Electricity | 3 | Active |
| US7154115B2 | Zoom in pin nest structure, test vehicle having the structure, and method of fabricating the structure | Electricity | 3 | Expired |
| US7305638B1 | Method and system for ROM coding to improve yield | Physics | 2 | Expired |
| US10268562B1 | Advanced manufacturing insight system for semiconductor application | Physics | 1 | Active |
| US12038802B2 | Collaborative learning model for semiconductor applications | Physics | 0 | Active |
| US10897814B2 | Characterization vehicles for printed circuit board and system design | Electricity | 0 | Active |
| US10656204B2 | Failure detection for wire bonding in semiconductors | Physics | 0 | Active |
| US10517169B2 | Characterization vehicles for printed circuit board and system design | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.