Patent · US Expired

Semiconductor device with temperature sensor

US7307328B2 · kind B2 · utility

31Cited by
6References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 30, 2005
Grant dateDec 11, 2007
Priority date
Expiry dateSep 30, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3011
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A semiconductor device is disclosed. In one embodiment the semiconductor device includes a semiconductor body of which is integrated a temperature sensor for measuring the temperature prevailing in the semiconductor body. The temperature sensor has a MOS transistor and a bipolar transistor. The MOS transistor is integrated into the semiconductor body nd configured such that the substhreshold current intensity of the MOS transistor is proportional to the temperature to be measured. The subthreshold current of the MOS transistor is amplified by the bipolar transistor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.