Signal test procedure for testing semi-conductor components and a test apparatus for testing semi-conductor components
US7317323B2 · kind B2 · utility
0Cited by
5References
19Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Sep 24, 2004 |
| Grant date | Jan 8, 2008 |
| Priority date | — |
| Expiry date | Sep 24, 2024 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5004
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to a test apparatus for testing semi-conductor components, and to a signal testing procedure, to be used especially during the testing of semi-conductor components. A signal is applied to a connection of a semi-conductor component, a reference signal is applied at a particular voltage level to a further connection of the semi-conductor component, the signal is compared with the reference signal, the voltage level of the reference signal is changed, and the signal is compared with the reference signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.