Method for the analysis of echelle spectra

US7319519B2 · kind B2 · utility

Assignees

• Gesellschaft zur Förderung angewandter Optik, Optoelektronik, Quantenelektronik und Spektroskopie e.V. · DE
• Gesellschaft zur Forderung der analytischen Wissenschaften e.V. · DE

Inventors

• Stefan Florek · Berlin, DE
• Michael Okruss · Potsdam, DE
• Helmut Becker-Ross · Berlin, DE

Key dates

• Filing date: Nov 3, 2001
• Grant date: Jan 15, 2008
• Expiry date: Jan 13, 2023

Classification

• Technology area (CPC G): Physics
• CPC primary: G01J2003/2866
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method for the wavelength calibration of echelle spectra, in which the wavelengths are distributed across number of orders is characterised by the steps: recording of a line-rich reference spectrum with known wavelengths for a number of the lines, determination of the position of a number of peaks of the reference spectrum in the recorded spectrum, selection of at least two first lines of known order, position and wavelength, determination of a wavelength scale for the order in which the known lines lie, by means of a fit function γm(x), determination of a provisional wavelength scale γ?m 1(x) for at least one neighboring order m 1, by means of addition/subtraction of a wavelength difference γFSR which corresponds to a free spectral region, according to γm 1 ?(x)=γm(x)γFSR with γFSR=γm(x)/m, determination of the wavelengths of lines in said neighboring order m 1, by means of the provisional wavelength scale γ 1(x), replacement of the provisional wavelength of at least two lines by the reference wavelength for said lines as obtained in step (a) and repeat of steps (d) to (g) for at least one further neighboring order.