Patent · US Expired

Automated design and execution of experiments with integrated model creation for semiconductor manufacturing tools

US7333871B2 · kind B2 · utility

50Cited by
317References
34Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 20, 2004
Grant dateFeb 19, 2008
Priority date
Expiry dateJan 20, 2024

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG05B17/02
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A method, system and medium of automation performed on a semiconductor manufacturing tool. The method creates a designed set of experiments for the tool and runs the created set of experiments. The method also collects data resulting from running the experiments and creates a model based on the collected data. The created model is used in automatically controlling the tool.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.