Device with stepped source/drain region profile
US7335959B2 · kind B2 · utility
75Cited by
11References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 6, 2005 |
| Grant date | Feb 26, 2008 |
| Priority date | — |
| Expiry date | Dec 9, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D62/021
Abstract
Embodiments of the invention provide a transistor with stepped source and drain regions. The stepped regions may provide significant strain in a channel region while minimizing current leakage. The stepped regions may be formed by forming two recesses in a substrate to result in a stepped recess, and forming the source/drain regions in the recesses.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.