Patent · US Expired

Semiconductor device

US7349250B2 · kind B2 · utility

5Cited by
0References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 15, 2005
Grant dateMar 25, 2008
Priority date
Expiry dateSep 27, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/037
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The degree of integration and the number of rewriting of a semiconductor device having a nonvolatile memory element are improved. A first MONOS nonvolatile-memory-element and a second MONOS nonvolatile-memory-element having a large gate width compared with the first MONOS nonvolatile-memory-element are mounted together on the same substrate, and the first MONOS nonvolatile-memory-element is used for storing program data which is scarcely rewritten, and the second MONOS nonvolatile-memory-element is used for storing processed data which is frequently rewritten.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.