Chuck for holding a device under test
US7352168B2 · kind B2 · utility
10Cited by
740References
16Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 15, 2005 |
| Grant date | Apr 1, 2008 |
| Priority date | — |
| Expiry date | Dec 10, 2025 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T279/35
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A chuck for a probe station.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.