Imaging inspection apparatus with improved cooling
US7354197B2 · kind B2 · utility
9Cited by
28References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 1, 2005 |
| Grant date | Apr 8, 2008 |
| Priority date | — |
| Expiry date | Sep 28, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2235/1262
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An imaging inspection apparatus which utilizes a plurality of individual imaging devices (e.g., X-ray Computer Tomography scanning devices) positioned on a frame for directing beams onto articles having objects therein to detect the objects based on established criteria. The apparatus utilizes a cooling structure to provide cooling to the imaging devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.