Patent · US Expired

Method and apparatus for avoiding dicing chip-outs in integrated circuit die

US7354790B2 · kind B2 · utility

1Cited by
1References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 18, 2005
Grant dateApr 8, 2008
Priority date
Expiry dateMar 3, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus for avoiding dicing chip-outs in integrated circuit die comprises: (a) providing a wafer for forming a plurality of integrated circuit die thereon; (b) forming the plurality of integrated circuit die on the wafer; and (c) forming a saw street between the integrated circuit die on the wafer to relieve cutting stress in the wafer when the integrated circuit die are separated by a dicing saw.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.