Test arrangement including anisotropic conductive film for testing power module
US7355431B2 · kind B2 · utility
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4Claims
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Key dates
| Filing date | Jun 1, 2005 |
| Grant date | Apr 8, 2008 |
| Priority date | — |
| Expiry date | Jun 1, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0735
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing apparatus and method for testing a semiconductor device, and more particularly a test arrangement for measuring a guaranteed power loss of a semiconductor module, not requiring the module to have on-board decoupling capacitors for the power loss test. The conventional pogo-pin array and test socket are replaced by a novel low cost anisotropic conductive elastomer and a low cost socket, the conductive polymer providing electrical communication between the socket and the module under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.