Methods and systems for determining a property of an insulating film
US7358748B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 30, 2005 |
| Grant date | Apr 15, 2008 |
| Priority date | — |
| Expiry date | Nov 30, 2025 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining a property of an insulating film is provided. The method may include obtaining a charge density measurement of the film, a surface voltage potential of the film relative to a bulk voltage potential of the substrate, and a rate of voltage decay of the film. The method may also include determining the property of the film using the charge density, the surface voltage potential, and the rate of voltage decay. A method for determining a thickness of an insulating film is provided. The method may include depositing a charge on the film, measuring a surface voltage potential of the film relative to a bulk voltage potential of the substrate, and measuring a rate of voltage decay of the film. The method may also include determining a thickness of the film using the rate of voltage decay and a theoretical model relating to current leakage and film thickness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.