Patent · US Expired

Semiconductor component, arrangement and method for characterizing a tester for semiconductor components

US7360139B2 · kind B2 · utility

3Cited by

8References

27Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Andreas Logisch · Hersbruck, DE
Monica De Castro Martins · Birkenfeld, DE
Bjorn Flach · Munich, DE
Wolfgang Ruf · Friedberg, DE
Martin Schnell · Berlin, DE
Ana Leao · Porto, PT

Key dates

Filing date	Oct 25, 2005
Grant date	Apr 15, 2008
Priority date	—
Expiry date	Mar 28, 2026

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/56
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A tester for semiconductor components with a plurality of channels is connected to a specific semiconductor component in order to characterize the signal path between tester and semiconductor component under production conditions. The specific semiconductor component includes measuring units that are connected to connection contacts and in each case provide the functionality of a signal generator, a signal detector, a digital communication interface and a receiving unit for trigger signals. The specific semiconductor component further includes a trigger logic to convey trigger signals between the receiving unit of a first one and the signal generator or detector of a second one of the measuring units.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.