Patent · US Expired

Methods for distributing programs for generating test data

US7386778B2 · kind B2 · utility

7Cited by

6References

39Claims

0Family size

Inventors

Jon Udell · West Linn, US
Chen Wang · Tigard, US
Mark Kassab · Wilsonville, US
Janusz Rajski · West Linn, US

Key dates

Filing date	Oct 20, 2005
Grant date	Jun 10, 2008
Priority date	—
Expiry date	Mar 30, 2026

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318314
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Described herein are methods and systems for distributed execution of circuit testing algorithms, or portions thereof. Distributed processing can result in faster processing. Algorithms or portions of algorithms that are independent from each other can be executed in a non-sequential manner (e.g., parallel) over a network of plurality of processors. The network includes a controlling processor that can allocate tasks to other processors and conduct the execution of some tasks on its own. Dependent algorithms, or portions thereof, can be performed on the controlling processor or one of the controlled processors in a sequential manner.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.