Inventor · Tigard, OR, US

Chen Wang

22Patents
7h-index
15Co-inventors
62Inventor score

Filing activity: Feb 13, 2004 → May 26, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US7370254B2 Compressing test responses using a compactor Physics 50 Expired
US7302624B2 Adaptive fault diagnosis of compressed test responses Physics 30 Expired
US7437640B2 Fault diagnosis of compressed test responses having one or more unknown states Physics 23 Expired
US7509550B2 Fault diagnosis of compressed test responses Physics 23 Active
US7743302B2 Compressing test responses using a compactor Physics 13 Active
US7890827B2 Compressing test responses using a compactor Physics 9 Active
US8051352B2 Timing-aware test generation and fault simulation Physics 8 Active
US7386778B2 Methods for distributing programs for generating test data Physics 7 Expired
US7509600B2 Generating test patterns having enhanced coverage of untargeted defects Physics 7 Expired
US7669101B2 Methods for distributing programs for generating test data Physics 6 Active
US9086454B2 Timing-aware test generation and fault simulation Physics 4 Active
US11090799B2 Socket holder and socket rack including the same Mechanical Engineering; Lighting; Heating 4 Active
US10632606B1 Socket holder and socket rack including the same Performing Operations; Transporting 4 Active
US7962820B2 Fault diagnosis of compressed test responses Physics 3 Active
US8201131B2 Generating test patterns having enhanced coverage of untargeted defects Physics 2 Active
US11320487B1 Programmable test compactor for improving defect determination Physics 1 Active
US9720040B2 Timing-aware test generation and fault simulation Physics 1 Active
US8560906B2 Timing-aware test generation and fault simulation Physics 1 Active
US9651622B2 Isometric test compression with low toggling activity Physics 1 Active
US7765450B2 Methods for distribution of test generation programs Physics 1 Expired
US10977400B2 Deterministic test pattern generation for designs with timing exceptions Physics 0 Active
US10509073B2 Timing-aware test generation and fault simulation Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.