Patent · US Expired

Backside method for fabricating semiconductor components with conductive interconnects

US7393770B2 · kind B2 · utility

312Cited by
42References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 19, 2005
Grant dateJul 1, 2008
Priority date
Expiry dateApr 22, 2026

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/53209
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A backside method for fabricating a semiconductor component with a conductive interconnect includes the step of providing a semiconductor substrate having a circuit side, a backside, and a substrate contact on the circuit side. The method also includes the steps of forming a substrate opening from the backside to the substrate contact, and then bonding the conductive interconnect to an inner surface of the substrate contact. A system for performing the method includes the semiconductor substrate, a thinning system for thinning the semiconductor substrate, an etching system for forming the substrate opening, and a bonding system for bonding the conductive interconnect to the substrate contact. The semiconductor component can be used to form module components, underfilled components, stacked components, and image sensor semiconductor components.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.