Patent · US Active

Probe for testing a device under test

US7394269B2 · kind B2 · utility

1Cited by
2References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 3, 2007
Grant dateJul 1, 2008
Priority date—
Expiry dateAug 3, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/06738
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.