Tim Lesher
16Patents
8h-index
15Co-inventors
65Inventor score
Filing activity: May 23, 2003 → Jun 11, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6815963B2 | Probe for testing a device under test | Physics | 66 | Expired |
| US7161363B2 | Probe for testing a device under test | Physics | 39 | Expired |
| US7271603B2 | Shielded probe for testing a device under test | Physics | 39 | Expired |
| US7057404B2 | Shielded probe for testing a device under test | Physics | 23 | Expired |
| US7304488B2 | Shielded probe for high-frequency testing of a device under test | Physics | 15 | Active |
| US7498829B2 | Shielded probe for testing a device under test | Physics | 10 | Active |
| US7482823B2 | Shielded probe for testing a device under test | Physics | 9 | Active |
| US7501842B2 | Shielded probe for testing a device under test | Physics | 9 | Active |
| US7518387B2 | Shielded probe for testing a device under test | Physics | 8 | Active |
| US7492172B2 | Chuck for holding a device under test | Physics | 8 | Expired |
| US7436194B2 | Shielded probe with low contact resistance for testing a device under test | Physics | 8 | Active |
| US7898273B2 | Probe for testing a device under test | Physics | 7 | Active |
| US7489149B2 | Shielded probe for testing a device under test | Physics | 7 | Active |
| US7876115B2 | Chuck for holding a device under test | Physics | 3 | Active |
| US7394269B2 | Probe for testing a device under test | Physics | 1 | Active |
| US11486898B2 | Multi-conductor transmission line probe | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.