Circuit and method for fuse disposing in a semiconductor memory device
US7395475B2 · kind B2 · utility
5Cited by
7References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jun 23, 2004 |
| Grant date | Jul 1, 2008 |
| Priority date | — |
| Expiry date | Apr 25, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/785
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A fuse disposing circuit executes a same test as in a state before a fuse is cut, even in case the fuse is cut. For this, the fuse disposing circuit in accordance with the invention includes a test mode enable confirmation section for informing whether a test mode is enabled; and a fuse set for providing a constant signal by using the output from the test mode enable confirmation section in case of the test mode, regardless of elimination or non-elimination of a fuse.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.