Component testing and recovery
US7404117B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 24, 2005 |
| Grant date | Jul 22, 2008 |
| Priority date | — |
| Expiry date | Oct 24, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2229/763
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed are systems and methods of producing electronic devices. These electronic devices include excess circuits to be used as replacements for circuits that are found to be defective within the electronic device. The excess circuits are included in a different device component than the circuits that are found to be defective. The replacement process occurs after the excess circuits and defective circuits are included in an electronic device including the different device components. Identification of the defective circuits may occur before or after the defective circuits are incorporated in the electronic device. In some embodiments, systems and methods of the invention result in improved manufacturing yields as compared with the prior art.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.