Patent · US Active

Integrated circuit to identify read disturb condition in memory cell

US7405964B2 · kind B2 · utility

32Cited by
4References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 27, 2006
Grant dateJul 29, 2008
Priority date
Expiry dateJul 27, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/3431
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method of operating a phase change memory array is disclosed and includes identifying a read disturb condition associated with the phase change memory array, and performing a conditional refresh operation in response to the identified read disturb condition. A phase change memory is also disclosed and includes an array of phase change memory cells, and a read disturb system configured to identify a read disturb condition and perform a refresh operation on the array in response thereto.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.