Qimonda North America Corp.
81Patents
81Active
81Granted
57Portfolio score
Filing activity: May 1, 2006 → Sep 21, 2010 · 81 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7515461B2 | Current compliant sensing architecture for multilevel phase change memory | Physics | 77 | Active |
| US7405964B2 | Integrated circuit to identify read disturb condition in memory cell | Physics | 32 | Active |
| US7796424B2 | Memory device having drift compensated read operation and associated method | Physics | 31 | Active |
| US7619917B2 | Memory cell with trigger element | Physics | 28 | Active |
| US7522073B1 | Self-adapted bus inversion | Electricity | 27 | Active |
| US7453081B2 | Phase change memory cell including nanocomposite insulator | Emerging Cross-Sectional Technologies | 27 | Active |
| US7623401B2 | Semiconductor device including multi-bit memory cells and a temperature budget sensor | Physics | 25 | Active |
| US7545668B2 | Mushroom phase change memory having a multilayer electrode | Electricity | 21 | Active |
| US8138028B2 | Method for manufacturing a phase change memory device with pillar bottom electrode | Electricity | 21 | Active |
| US7571901B2 | Circuit for programming a memory element | Physics | 21 | Active |
| US7539050B2 | Resistive memory including refresh operation | Physics | 20 | Active |
| US7822910B2 | Method of flexible memory segment assignment using a single chip select | Physics | 19 | Active |
| US7440347B1 | Circuit and method to find wordline-bitline shorts in a DRAM | Physics | 18 | Active |
| US7593255B2 | Integrated circuit for programming a memory element | Physics | 17 | Active |
| US7714315B2 | Thermal isolation of phase change memory cells | Electricity | 16 | Active |
| US7710754B2 | Method of simple chip select for memory subsystems | Electricity | 15 | Active |
| US7679980B2 | Resistive memory including selective refresh operation | Physics | 15 | Active |
| US7515455B2 | High density memory array for low power application | Physics | 14 | Active |
| US7694196B2 | Self-diagnostic scheme for detecting errors | Electricity | 14 | Active |
| US7719886B2 | Multi-level resistive memory cell using different crystallization speeds | Emerging Cross-Sectional Technologies | 14 | Active |
| US7746098B2 | Termination switching based on data rate | Emerging Cross-Sectional Technologies | 13 | Active |
| US7457146B2 | Memory cell programmed using a temperature controlled set pulse | Physics | 11 | Active |
| US7639066B2 | Circuit and method for suppressing gate induced drain leakage | Physics | 11 | Active |
| US7765418B2 | Multi-mode voltage supply circuit | Physics | 11 | Active |
| US7932507B2 | Current constricting phase change memory element structure | Electricity | 10 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.