Patent · US Expired

Device and method for the optical measurement of an optical system by using an immersion fluid

US7408652B2 · kind B2 · utility

7Cited by
10References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 16, 2005
Grant dateAug 5, 2008
Priority date
Expiry dateJan 5, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/706
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

A device for the optical measurement of an optical system, in particular an optical imaging system, is provided. The device includes at least one test optics component arranged on an object side or an image side of the optical system. An immersion fluid is adjacent to at least one of the test optics components. A container for use in this device, a microlithography projection exposure machine equipped with this device, and a method which can be carried out with the aid of this device are also provided. The device and method provide for optical measurement of microlithography projection objectives with high numerical apertures by using wavefront detection with shearing or point diffraction interferometry, or a Moiré measuring technique.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.