Inventor · Aalen, DE

Uwe Schellhorn

9Patents
3h-index
21Co-inventors
53Inventor score

Filing activity: Aug 14, 2002 → Nov 14, 2012

Most-cited inventions

PatentTitleAreaCited byStatus
US6816247B1 Moiré method and a system for measuring the distortion of an optical imaging system Physics 15 Expired
US7408652B2 Device and method for the optical measurement of an optical system by using an immersion fluid Physics 7 Expired
US7019824B2 Moire method and measuring system for measuring the distortion of an optical imaging system Physics 4 Expired
US8416412B2 Method for determination of residual errors Physics 3 Active
US7400388B2 Method for determining distortion and/or image surface Physics 2 Expired
US8473237B2 Method for calibrating a specimen stage of a metrology system and metrology system comprising a specimen stage Physics 2 Active
US8988752B2 Beam control apparatus for an illumination beam and metrology system comprising an optical system containing such a beam control apparatus Physics 1 Active
US7119910B1 Phase shifting wavefront interference method Physics 1 Expired
US8120763B2 Device and method for the optical measurement of an optical system by using an immersion fluid Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.