Patent · US Expired

Insertable calibration device

US7414421B2 · kind B2 · utility

1Cited by

9References

19Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Bjorn Flach · Munich, DE
Andreas Logisch · Hersbruck, DE
Monica De Castro Martins · Birkenfeld, DE
Wolfgang Ruf · Friedberg, DE
Martin Schnell · Berlin, DE

Key dates

Filing date	Nov 30, 2005
Grant date	Aug 19, 2008
Priority date	—
Expiry date	Dec 29, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG11C2029/5602
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

An insertable calibration device for a programmable tester apparatus comprises at least one calibration unit and a control unit. The progammable tester apparatus is configured to test at least one electronic device with electronic circuits. The progammable tester apparatus comprises a holding device, contact-making devices for the electronic device, and tester channels for coupling in signals to the electronic device. The calibration unit is connected to a first tester channel to be calibrated. The calibration unit is configured to detect a calibration signal edge of a calibration signal that is transmitted by the tester apparatus at a certain transmission instant, to detect a reference signal edge of a reference signal that is transmitted by the tester apparatus via a second tester channel at a reference instant, to compare the instants at which the two signal edges arrive, and to output a comparison result. The control unit evaluates the comparison results and can be used to program the transmission instants in such a way that the instants at which the calibration signal edge and the reference signal edge arrive, for the compensation of signal propagation time differences, are su…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.