Semi-conductor component test device with shift register, and semi-conductor component test procedure
US7415649B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 20, 2005 |
| Grant date | Aug 19, 2008 |
| Priority date | — |
| Expiry date | May 19, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C5/04
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to a semi-conductor component test procedure, as well as to a semi-conductor component test device with a shift register, which comprises several memory devices from which pseudo-random values (BLA, COL, ROW) to be used for testing a semi-conductor component are able to be tapped and emitted at corresponding outputs of the semi-conductor component test device, whereby the shift register comprises at least one further memory device, from which a further pseudo-random value (VAR) is able to be tapped and whereby a device is provided, with which the further pseudo-random value (VAR) can selectively, if needed, be emitted at at least one corresponding further output of the semi-conductor component test device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.