Double sided probing structures
US7420381B2 · kind B2 · utility
8Cited by
951References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 8, 2005 |
| Grant date | Sep 2, 2008 |
| Priority date | — |
| Expiry date | Sep 8, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0408
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test configuration for double sided probing of a device under test includes a holder to secure the device under test in a first orientation, a calibration substrate secured in a second orientation and a probe capable of calibration using the calibration substrate and probing the device under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.