Patent · US Expired

Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure

US7421629B2 · kind B2 · utility

6Cited by
12References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 20, 2005
Grant dateSep 2, 2008
Priority date—
Expiry dateApr 19, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2029/5602
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The invention relates to a semi-conductor component test procedure, and a semiconductor component test device (10b), which comprise:

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.