Patent · US Active

Contact structure for a stack DRAM storage capacitor

US7439125B2 · kind B2 · utility

1Cited by
3References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 24, 2006
Grant dateOct 21, 2008
Priority date
Expiry dateSep 21, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/0335
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for fabricating a contact structure for a stack storage capacitor includes forming the contact structure in a node contact region with contact openings, an insulating liner and a conductive filling material prior to the patterning of bit lines.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.