Patent · US Expired

Nonplanar semiconductor device with partially or fully wrapped around gate electrode and methods of fabrication

US7456476B2 · kind B2 · utility

173Cited by
185References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 27, 2003
Grant dateNov 25, 2008
Priority date
Expiry dateDec 26, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/017

Abstract

A nonplanar semiconductor device and its method of fabrication is described. The nonplanar semiconductor device includes a semiconductor body having a top surface opposite a bottom surface formed above an insulating substrate wherein the semiconductor body has a pair laterally opposite sidewalls. A gate dielectric is formed on the top surface of the semiconductor body on the laterally opposite sidewalls of the semiconductor body and on at least a portion of the bottom surface of semiconductor body. A gate electrode is formed on the gate dielectric, on the top surface of the semiconductor body and adjacent to the gate dielectric on the laterally opposite sidewalls of semiconductor body and beneath the gate dielectric on the bottom surface of the semiconductor body. A pair source/drain regions are formed in the semiconductor body on opposite sides of the gate electrode.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.