Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
US7478345B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Sep 30, 2005 |
| Grant date | Jan 13, 2009 |
| Priority date | — |
| Expiry date | Sep 30, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31937
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods consistent with principles of the present invention allow contactless measurements of voltage characteristics of dynamic electrical signals in integrated circuits. The invention utilizes a signal analysis circuit, such as a voltage comparator, disposed with the circuit under test, which is optically coupled with the external timing measurement equipment. The signal analysis circuit changes its state depending on the characteristics of the measured electrical signal applied thereto. The changes in the condition of the signal analysis circuit are sensed by the external timing measurement equipment provided outside the circuit under test. To this end, the signal analysis circuit is optically coupled with the external measurement equipment registering specific changes in the condition of the signal analysis circuit. The information on the condition of the signal analysis circuit registered by the external measurement equipment is used to study the characteristics of the dynamic electrical signals within the circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.