Patent · US Active

Securing the test mode of an integrated circuit

US7484152B2 · kind B2 · utility

1Cited by
6References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 8, 2006
Grant dateJan 27, 2009
Priority date
Expiry dateMar 18, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/46
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

An electronic circuit includes a logic circuit formed from a plurality of logic units. The electronic circuit also includes a plurality of memory units capable of forming a shift register, capable of being connected to the logic units, and having terminals for reception of command signals to write data into the logic units and to read data from the logic units. The electronic circuit further includes an access controller having a plurality of outputs connected to the terminals of the memory units and capable of applying the command signals to the outputs. In addition, the electronic circuit includes a scrutinizing module capable of a plurality of functions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.