Inventor · Les Pennes-Mirabeau, FR

David Hely

17Patents
2h-index
6Co-inventors
43Inventor score

Filing activity: Jan 24, 2005 → Sep 11, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US8495734B2 Method and device for detecting an erroneous jump during program execution Physics 5 Active
US7577886B2 Method for testing an electronic circuit comprising a test mode secured by the use of a signature, and associated electronic circuit Physics 3 Active
US7747935B2 Method and device for securing the reading of a memory Physics 2 Active
US10289577B2 System, method and computer-accessible medium for low-overhead security wrapper for memory access control of embedded systems Physics 2 Active
US7768318B2 Detection of a disturbance in the state of an electronic circuit flip-flop Physics 2 Active
US7512852B2 Protecting an integrated circuit test mode Physics 2 Expired
US7694197B2 Integrated circuit comprising a test mode secured by detection of the state of a control signal Physics 2 Active
US7921342B2 Integrated circuit comprising a test mode secured by the use of an identifier, and associated method Physics 1 Active
US7725786B2 Protecting an integrated circuit test mode Physics 1 Active
US11531785B2 PUF-based data integrity Physics 1 Active
US7478293B2 Method of securing the test mode of an integrated circuit via intrusion detection Physics 1 Expired
US7484152B2 Securing the test mode of an integrated circuit Physics 1 Active
US7568140B2 Integrated circuit having configurable cells and a secured test mode Physics 1 Active
US7308635B2 Integrated circuit comprising a test mode secured by initialization of the test mode Physics 1 Expired
US7676717B2 Electronic circuit comprising a test mode secured by the breaking of a test chain, and associated electronic circuit Physics 0 Active
US11343109B2 Secure enrollment for physical unclonable function devices Electricity 0 Active
US7930605B2 Electronic circuit comprising a test mode secured by insertion of decoy data in the test chain, associated method Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.