Patent · US Active

Discrete polarization state spectroscopic ellipsometer system and method of use

US7492455B1 · kind B1 · utility

12Cited by
17References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 10, 2006
Grant dateFeb 17, 2009
Priority date
Expiry dateJun 6, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/213
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A spectroscopic ellipsometer system comprising a plurality of individual sources which are sequentially energized to provide a sequence of beams, each of different polarization state but directed along a common locus toward a sample. The preferred spectroscopic ellipsometer system has no parts which move during data collection, and it provides a progressive plurality of sequentially discrete, rather than continuously varying, polarization states.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.