Continuous application and decompression of test patterns to a circuit-under-test
US7493540B1 · kind B1 · utility
Inventors
Key dates
| Filing date | Jul 20, 2000 |
| Grant date | Feb 17, 2009 |
| Priority date | — |
| Expiry date | Jan 7, 2022 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318335
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for applying test patterns to scan chains in a circuit-under-test. The method includes providing a compressed test pattern of bits; decompressing the compressed test pattern into a decompressed test pattern of bits as the compressed test pattern is being provided; and applying the decompressed test pattern to scan chains of the circuit-under-test. The actions of providing the compressed test pattern, decompressing the compressed test pattern, and applying the decompressed pattern are performed synchronously at the same or different clock rates, depending on the way in which the decompressed bits are to be generated. A circuit that performs the decompression includes a decompressor such as a linear finite state machine adapted to receive a compressed test pattern of bits. The decompressor decompresses the test pattern into a decompressed test pattern of bits as the compressed test pattern is being received. The circuit further includes scan chains for testing circuit logic, the scan chains coupled to the decompressor and adapted to receive the decompressed test pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.