Protecting silicon germanium sidewall with silicon for strained silicon/silicon mosfets
US7498602B2 · kind B2 · utility
4Cited by
88References
18Claims
0Family size
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Key dates
| Filing date | Apr 6, 2006 |
| Grant date | Mar 3, 2009 |
| Priority date | — |
| Expiry date | Feb 20, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D30/791
Abstract
Raised Si/SiGe source and drain regions include epitaxially grown silicon on SiGe sidewalls. The epi silicon prevents adverse effects of Ge during silicidation, including Ge out diffusion and silicide line breakage. The Si also increases the active area.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.