Patent · US Active

Memory with resistance memory cell and evaluation circuit

US7499349B2 · kind B2 · utility

14Cited by
2References
11Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 7, 2007
Grant dateMar 3, 2009
Priority date
Expiry dateFeb 15, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2213/79
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A memory circuit comprising a memory cell which has a resistance memory element and is connected between a ground terminal and a capacitor has a reference memory cell with a reference resistor which is connected between the ground terminal and a reference capacitor, in which case, during the reading operation of the memory cell, the memory cell and the reference memory cell are switched on in order to charge or discharge the capacitor and the reference capacitor, and an evaluation device evaluates the difference between the electrical potentials of the capacitor and the reference capacitor at a predetermined instant after the switching-on of the memory cell and the reference memory cell.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.