Chuck for holding a device under test
US7501810B2 · kind B2 · utility
11Cited by
764References
10Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Oct 23, 2007 |
| Grant date | Mar 10, 2009 |
| Priority date | — |
| Expiry date | Oct 23, 2027 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T279/35
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A chuck for a probe station.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.