Shielded probe for testing a device under test
US7501842B2 · kind B2 · utility
9Cited by
992References
53Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 19, 2007 |
| Grant date | Mar 10, 2009 |
| Priority date | — |
| Expiry date | Oct 19, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06738
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies may include a dielectric substrate that supports a signal path interconnecting test instrumentation and a probe tip and a ground path that shields both the signal path and the probe tip.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.