Integrated circuit diagnosing method, system, and program product
US7503021B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 16, 2005 |
| Grant date | Mar 10, 2009 |
| Priority date | — |
| Expiry date | Jan 24, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides a method, system, and program product for diagnosing an integrated circuit. In particular, the invention captures one or more images for each relevant circuit layer of the integrated circuit. Based on the image(s), a component netlist is generated. Further, a logic netlist is generated by applying hierarchical composition rules to the component netlist. The component netlist and/or logic netlist can be compared to a reference netlist to diagnose the integrated circuit. The invention can further generate a schematic based on the component netlist or logic netlist in which components are arranged according to port, power, and/or component pin connection information determined from the netlist. Further, the schematic can be displayed in a manner that wiring connections are selectively displayed to assist a user in intelligently arranging the circuit components.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.