Patent · US Active

Method of processing a workpiece in a plasma reactor employing a dynamically adjustable plasma source power applicator

US7504041B2 · kind B2 · utility

6Cited by
7References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 3, 2006
Grant dateMar 17, 2009
Priority date
Expiry dateSep 9, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67069
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method for processing a workpiece in a plasma reactor chamber having radially inner and outer source power applicators at a ceiling of the chamber facing the workpiece, the inner and outer source power applicators and the workpiece sharing a common axis of symmetry. The method includes applying RF source power to the source power applicator, and introducing a process gas into the reactor chamber so as to carry out a plasma process on the workpiece characterized by a plasma process parameter, the plasma process parameter having a spatial distribution across the surface of the workpiece. The method further includes rotating at least the outer RF source power applicator about a radial tilt axis to a position at which the spatial distribution of the plasma process parameter has at least a nearly minimal non-symmetry relative to the common axis of symmetry, and translating the inner source power applicator relative to the outer source power applicator along the axis of symmetry to a location at which the spatial distribution has at least a nearly minimal non-uniformity across the surface of the workpiece.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.