Patent · US Expired

Protecting an integrated circuit test mode

US7512852B2 · kind B2 · utility

2Cited by
11References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 24, 2005
Grant dateMar 31, 2009
Priority date
Expiry dateNov 14, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318536
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An electronic circuit, including; a logic circuit having a plurality of logic cells; storage cells able to form a shift register, able to be connected to the logic cells; a connecting control module having an input for the reception of an identification key, the module connecting the storage cells so as to form a test shift register when the receive input receives a valid identification key, and the module connecting the storage cells so as to form randomly a diversion circuit when the input does not receive a valid identification key. The invention allows the electronic circuit to be protected against fraudulent access in read or write mode. The invention also relates to a smart card including this electronic circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.