Patent · US Active

Polymer, resist composition, and patterning process

US7537880B2 · kind B2 · utility

146Cited by
4References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 3, 2007
Grant dateMay 26, 2009
Priority date
Expiry dateOct 3, 2027

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S430/111
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

To a resist composition, an alkali-soluble polymer having fluorinated ester-containing lactone units incorporated therein is included as an additive. The resist composition forms a resist film having a reduced contact angle after development. The resist film prevents water penetration during immersion lithography.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.